Ctech Instruments

METALLURGICAL LABORATORY EQUIPMENTS > IMAGE ANALYSER

  • Image Analyser

Image Analyser

The Image Analysis system comprising of the followings:
  1. Two glass containers: One Beaker 2000 cc. For use of polishing table and the other a petridish for use in external etching.
  2. DC supply cord for use with polishing table and with external etching.
  3. Supply cord for Electrolyte pump.
  4. Extra copper cathode for polishing cell.
TRINOCULAR METALLURGICAL MICROSCOPE: Microscope Stand : Rigid & stable stand with ball bearing guide ways & slides
Viewing Head : Binocular interchangeable with Trinocular Head for microphotography & CCTV Projection system
Focussing : Co-axial Coarse & fine focusing module
Stage : Large size stage with co-axial low drive, for convenient viewing of specimens Illumination : Incident light through Epi-illuminator with Field Aperture Diaphragm and filter slots. Continuously variable luminosity control through built-in Electronic Transformer.
Objectives : High fidelity flat field objectives M5x, M10x, M45x and M 100x oil
Eyepieces : Compensation Widefield 10x & 15x paired
Magnification : 50x-1500x
DIGITAL COLOUR CCD CAMERA: Camera pick-up element size - 1/3" It will have interline transfer CCD Image sensor, Resolution HN will be more than 400 TV lines (Center) It will have three chips with variety of frame grabbing speeds and resolution from reputed makes like water, lYC, Seny Pulnix
IMAGE GRABBER CARD: High resolution scientific image grabber card Spatial resolution: 768 '" 576 (50 Hz) minimum Video format: Composite video and S-video (Y /e) formats, RS170, RS-330 and NTSC (60 Hz) or CCIR and PAL (50 Hz), interfaced software selectable Bus type: ISA Inputs: 1 active input, composite or S-video, AC coupled video Signal 1 volt peak to peak Camera Adapter. Will be suitable for microscope supplied with the system
SOFTWARE MODULES: Grain size measurement, by Heyn intercept and Jeffries planimetry method (ASTM - El12 / E1382-91) I Austenitic grain size measurement Phase analysis (Percentage, volume and Area Fraction) and distribution of phases (ASTM - E -562) Linear Measurements like plating, coating, decarburization, banding etc. Nodule count (% Modularity Analysis), Distribution, nodule classification etc.(ASTM E 247). Graphite Flake analysis for size class and separation of A, C, D, E flakes and their exact % estimation (ASTM A-247-67) Inclusion Analysis (ASTM E 45/ E 1122) separation and rating Dendritic arm spacing Porosity measurement (size and distribution analysis) with particle count & size analysis Image database management software
  • With facility of comparison of images
  • Reporting in MS Word/MS Excel of microstructure images, results, graphs etc.
  • Customized software according to users requirements
  • Software will comply with International Standards like ASTM, JIS,DIN etc.
STANDARD ACCESSORIES LIKE:
  • Optical to mechanical adapter
  • CCD to Microscope interface
  • Power source for CCD camera & Metallurgical Microscope with voltage stabilizer
  • Electric cables etc.